Impact of Scan Rate and Mobile IonConcentration on the Anomalous J-V Curves ofMetal Halide Perovskite-Based Memristors
Authors: José Carlos Pérez-Martínez, Diego Martín-Martín, Gonzalo del Pozo, Belén Arredondo, Antonio Guerrero, Beatriz Romero
Journal Name: IEEE ELECTRON DEVICE LETTERS
Year of Publication: 2023
Volume: 44
Pagination: 1276-1279
Acknowledgments: This work was supported in part by Comunidad de Madrid under the SINFOTON2-CM Research Program under Grant S2018/NMT-4326-SINFOTON2-CM ; and in part by Universidad Rey Juan Carlos (URJC) (Research Program “Programa de Fomento y Desarrollo de la Investigación”) under Grant M2417, Grant, M2180, and Grant M2363. The work of Antonio Guerrero was supported by Ministerio de Ciencia e Innovación of Spain (MICINN) under Grant PID2019-107348GB-100.
Article Page: https://ieeexplore.ieee.org/document/10158999